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System
Solutions
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Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or
production-testing a CMOS image sensor for a digital camera, Pulse Instruments
can supply you with a fully-integrated test system that allows you to focus on your your
device, not on your test system. Pulse Instruments can supply every electrical
component of your test system, including pattern generation, clock drivers,
low-noise DC bias, A/D
conversion, data acquisition, and system software for complete control, analysis
and reporting capabilities.
Furthermore, our more than 30 years of experience building
test equipment and systems means that we can provide total system integration,
with an expert eye towards the technical hurdles that make image sensor testing different
from mainstream mixed-signal testing. The architecture is designed for
system-wide noise immunity and noise reduction, and our stimulus and acquisition
electronics were designed from the bottom up for testing CCDs, FPAs and CMOS
imagers. Our specialization also means that our systems are far more affordable
than the "big iron" available from the other ATE vendors.
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We offer three
primary system models, described in the table below. Each model describes a
"baseline" system that can be configured and customized to meet your specific
testing requirements. Please select a
system based on the types of devices you are testing and your primary testing
application:
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System
7700
Characterization System |
System
1828
Production Test
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System 1808
Production Test
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Test
Applications |
• R&D and engineering characterization
• Mid-volume production test
• Low-volume production test for critical parts
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• Production test
• R&D and engineering characterization
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• Production test
• Limited R&D and engineering characterization
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Devices |
• Military, science-grade and medical CCDs or IR FPAs
• CMOS ROICs and multiplexers
• CMOS sensors
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• Commercial/industrial CCDs, IR FPAs, ROICs, multiplexers, and CMOS sensors
• Medical imaging devices
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• Digital image sensors (CCDs or CMOS) for consumer
applications
• Telecom and logic devices
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System
Features |
• High-performance, low-cost, open architecture
• Low-noise system architecture
• Small footprint with high instrument density
• Expandable for future applications
• Highest speeds
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• High performance, low-cost system
• Modular design
• Modest footprint
• High throughput
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• Lowest-cost, open architecture
• Smallest footprint
• Expandable to meet new requirements
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This
diagram below illustrates Pulse Instruments' modular approach to building
systems. Each component
of the system can be independently configured. This provides several key
benefits:
- The system can be optimally configured for your specific
application. You buy only the capacity and features you need, when you need them
- You can upgrade the system as your requirements change and your budget
permits
- System uptime is maximized because cards and most modules can be swapped
out in the field, by the user
- Third-party hardware can be integrated into the system at very little cost
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Each of our systems includes PI-DATS, our graphical system software for
automated test and control. PI-DATS runs under Windows
2000, which means that the
user interface is immediately familiar to any user. No programming experience is
required to use PI-DATS. You can configure and run a completely automated test
of a complex FPA or CCD without writing a single line of code.
PI-DATS sets up and controls all the hardware in the system, and stores all
settings (including device-specific settings) in a single file. When you want to
change the type of device-under-test, simply load a new file.
Included with PI-DATS are several powerful analysis and reporting routines,
as well as the ability to export data to MATLAB, Excel, or a documented binary
format.
Clocking and programming of your device-under-test is performed through the PI-PAT
module of PI-DATS. In addition, PI-DATS can pass variables to PI-PAT to vary
pattern execution time. This can be used to vary integration time on a CCD, for
example. PI-PAT has powerfully simple
click-and-drag waveform generation, plus a re-usable subpattern architecture
that allows you to test an entire family of related devices with a single timing
file.
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There are Pulse Instruments test systems throughout the industry, both here in the U.S.
and in Europe, Asia, India and in the Middle East. Pulse Instruments
applications engineers provide training and preliminary acceptance testing at
our facility in Torrance, California, and then install the system and perform
final acceptance testing at your facility upon delivery. Most customers are
up and running, testing parts, within a few days of installation.
Pulse Instruments engineers are committed to keeping your system up and
running. We handle all service and repair with our in-house technical staff.
Equipment repairs and upgrades are handled at our facility, but our engineers
are also available to travel to your site for systems integration or application
support.
Today, Pulse Instruments systems are used for characterization and
production test of visible and infrared imaging devices used in missile-guidance
systems, weapon sights, astronomy satellites, surveillance equipment, machine
vision, automated inspection, medical imaging, and night vision applications
from many major manufacturers of image sensors. There are Pulse Instruments
systems and equipment installed in the early 1980's that are still going strong
today.
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Because every
application is different, we can provide a more accurate quotation if we have
detailed information about your application. Please review the following
questionnaire(s) so that our applications engineers can help configure a system
that meets your budget and your requirements:
These surveys require the Adobe® Acrobat Reader, freely available from Adobe's
website. These questionnaires are intended as discussion guides to ensure
that you and our applications engineers can fully discuss your requirements.
Alternatively, email us a datasheet for the device(s) you are testing. We are always available to answer
your questions at:
We look forward to working with you.
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