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System 4700 Automated FPA Test System

Turnkey Systems > System 4700

The Pulse Instruments System 4700 Automated FPA Test System is the product of years of experience in the design of instrumentation and systems for the testing of CCDs, CMOS imagers, IR Detectors, and Focal Plane Arrays.

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The system is flexible and expandable, with standard options and software that will allow your system to expand as your needs change.

The system can be enhanced with the addition of cards for different clock speeds, bias currents, four quadrant bias supplies (force voltage/limit current, force current/limit voltage function), and additional data acquisition channels to meet your specific requirements for low noise, speed and accuracy.

There are a variety of test heads available which are easily interchanged. The test configuration can be changed in minutes. The interface to the device under test (DUT) is a line of dewars and interface cards designed specifically for the Test System.

The purchase of a system includes training and installation by Pulse Instruments personnel to ensure you can start testing your parts within days of the arrival of the test system.


System 4700 Features | Datasheet | Ordering | System 1828

 


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