The 4000 Series Clock Driver and Low Noise DC Bias System
was designed specifically for the stringent requirements necessary for the testing of Charge Coupled
Devices (CCD's), IR Detectors, and Focal Plane Arrays (FPAs).It provides high accuracy, low noise clock drivers and DC biases
with the capability to drive almost every CCD and IR Detector Array manufactured to date.
All clock drivers and Bias supplies are independently programmable.
Ease of configuration and expansion protects your investment
in the instrument, which is backed up by Pulse Instruments' commitment to keep the system
current in capabilities as new devices are introduced, thereby protecting your investment
in the future.
The system uses separate mainframes to isolate the
digital electronics used to program and control the instrument from the DC Bias and clock driver
cards. This isolation is accomplished both optically and through the use of separate power
sources, providing a very high level of noise immunity for the clock drivers and
The separate mainframe structure allows the clock drivers and
DC bias supplies located in the PI-4002 Instrument Mainframe to be located in close
proximity to the Device Under Test (DUT), if desired, while the digital electronics
located in the Control Mainframe can be placed in a more remote area.
There is also protection against transients that could damage your
DUT. When the power is turned on or off, the output voltage levels on all drivers and
bias supplies are held within the range of
The system requires one Control Mainframe,
at least one PI-4002
Instrument Mainframe, and a PI-4003 DC Power Mainframe.